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field-ionization microscope

field-ionization microscope (field-ion microscope; FIM) A type of electron microscope that is similar in principle to the field-emission microscope, except that a high positive voltage is applied to the metal tip, which is surrounded by low-pressure gas (usually helium) rather than a vacuum. The image is formed in this case by field ionization: ionization at the surface of an unheated solid as a result of a strong electric field creating positive ions by electron transfer from surrounding atoms or molecules. The image is formed by ions striking the fluorescent screen. Individual atoms on the surface of the tip can be resolved and, in certain cases, adsorbed atoms may be detected.

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