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EMSL Capability Video: FIB-SEM

Read the transcript http://www.emsl.pnl.gov/news/docs/fim_sem_transcript.pdf . Learn more about the capabilities of our focused ion beam scanning electron microscope. EMSL experts Lax Saraf and Bruce Arey describe how the instrument can provide site-specific analysis and slicing capabilities with high resolution of biological and material science samples. This video is to be the first in a series of capability videos produced at EMSL.

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