Focus on microelectronics failure analysis. (22nd International Symposium for Testing and Failure Analysis) From: Advanced Materials & Processes | Date: November 1, 1996 | COPYRIGHT 1996 ASM International. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan.  All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information) Copyright information

Los Angeles, CA, will host the 22nd International Symposium for Testing and Failure Analysis from Nov. 18-22, 1996. The symposium, which will include 15 technical sessions and a panel discussion, aims to address failure-analysis problems concerning all electronic devices. Some 80 companies are participating in a two-day exposition that will be held simultaneously with the symposium. A Microelectronics Workshop featuring 21 tutorials will also be held. Some of the new equipment that will be featured at the symposium are presented.

ISTFA/96 offers a unique opportunity to learn about advances ...

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