ATE, inspection systems, and instruments debut: Productronica 2003, November 11-14, Munich, Germany, www.productronica.de.(ShowHighlights) From: Test & Measurement World | Date: December 1, 2003 | COPYRIGHT 2003 Reed Business Information. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan.  All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information) Copyright information

SUSS MicroTec Test Systems (www.suss.de) demonstrated its PAV 150, a semiautomatic wafer-probe system for RF MEMS devices. It can test 200-mm wafers in a vacuum environment and has a platen capable of holding up to eight probe heads, four of which can hold RF probes.... Rohde & Schwarz (www.rohde-schwarz.com) demonstrated its new TS7110 fixture, designed to provide for electrical, mechanical, and acoustic tests. The company also demonstrated its new 100-kHz to 6-GHz SMU200A and 9-kHz to 3-GHz SM300 vector signal generators, its AM300 arbitrary/function generator, and its FSU46 ...

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