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Mass absorption coefficient of tungsten and tantalum, 1450 eV to 2350 eV: experiment, theory and application.
From:
Journal of Research of the National Institute of Standards andTechnology
| Date:
January 1, 2003| Author:
Levine, Zachary H.; Grantham, Steven; Tarrio, Charles; Paterson, David J.; McNulty, Ian; Levin, T.M.; Ankudinov, Alexei L.; Rehr, John J.
| COPYRIGHT 2003 National Institute of Standards and Technology. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group.Copyright information
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The mass absorption coefficients of tungsten and tantalum were measured with soft x-ray photons from 1450 eV to 2350 eV using an undulator source. This region includes the [M.sub.3], [M.sub.4], and [M.sub.5] absorption edges. X-ray absorption fine structure was calculated within a real-space multiple scattering formalism; the predicted structure was observed for tungsten and to a lesser degree tantalum as well. Separately, the effects of dynamic screening were observed as shown by ...
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